3Wave Instruments from Switzerland launches the Laser-Optical Second Harmonics Generation setup for Real-Time Monitoring of Key Material Properties During Thin-Film Growth.
In this webinar we will present scientific and technical details of this unique thin film diagnostics setup integrated on PLD thin film deposition solutions from Demcon TSST.
Webinar program:
9:00
Introduction
Rik Groenen, Demcon TSST
9:10
Real-Time Monitoring of Key Material Properties During Thin-Film Growth
Manfred Fiebig & Morgan Trassin, ETH Zurich, 3Wave Instruments
9:30
3Wave’s Advanced Optical Materials Analysis Platform;
Hardware and Software: Features and User Experience.
Jannis Lehmann, ETH Zurich, 3Wave Instruments
9:40
From ETH Zurich Lab to Research & Industry: Ready, Reliable, Proven
Jens Geiger, 3Wave Instruments
9:45
Demcon TSST Installation & Services
Rik Groenen, Demcon TSST
9:50
Q&A and closing